Rei Kudo, Takeshi Sugawara, Kazuo Sakiyama, Yuko Hara-Azumi, and Yang Li, “Revisiting System Noise in Side-Channel Attacks: Mutual Assistant SCA vs. Genetic Algorithm,” Asian Hardware Oriented Security and Trust Symposium (AsianHOST’21), IEEE, pp.1–6 (Dec., 2021).
Saya Inagaki, Mingyu Yang1, Yang Li, Kazuo Sakiyama, and Yuko Hara-Azumi, “Examining Vulnerability of HLS-designed Chaskey-12 Circuits to Power Side-Channel Attacks,” International Symposium on Quality Electronic Design (ISQED’22), IEEE, 1page (Apr., 2022).
Tomoaki Kitahara, Ryota Hira, Yuko Hara-Azumi, Daiki Miyahara, Yang Li, and Kazuo Sakiyama, “Optimized Software Implementations of Ascon, Grain-128AEAD, and TinyJambu on ARM Cortex-M,” In Proc. International Symposium on Computing and Networking, CANDAR Workshops (CANDARW’22), IEEE, pp.316–322 (Nov., 2022).
李陽, 崎山一男, “Single-Chip Implementation and Evaluation of Passive UHF RFID Tag with Hash-Based Mutual Authentication,” Hot Channel Workshop 2014 (2014年10月7日).
Yang Li, Kazuo Ohta, and Kazuo Sakiyama, “A New Type of Fault-Based Attack: Fault Behavior Analysis,” IEICE Trans. Fundam. Electron. Commun. Comput. Sci., Vol.E96-A, No.1, pp.177–184 (Jan., 2013).
Kazuo Sakiyama, Yang Li, Shigeto Gomisawa, Yu-ichi Hayashi, Mitsugu Iwamoto, Naofumi Homma, Takafumi Aoki, and Kazuo Ohta, “Practical DFA Strategy for AES Under Limited-Access Conditions,” Journal of Information Processing, Vol.22, No.2, 142–151 (Feb., 2014).
Christophe Clavier, Jean-Luc Danger, Guillaume Duc, M. Abdelaziz Elaabid, Benoît Gérard, Sylvain Guilley, Annelie Heuser, Michael Kasper, Yang Li, Victor Lomné, Daisuke Nakatsu, Kazuo Ohta, Kazuo Sakiyama, Laurent Sauvage, Werner Schindler, Marc Stöttinger, Nicolas Veyrat-Charvillon, Matthieu Walle, Antoine Wurcker, “Practical improvements of side-channel attacks on AES: feedback from the 2nd DPA contest,” J. Cryptographic Engineering, Vol.4(1), pp.259–274 (Apr., 2014).
中曽根俊貴, 李陽, 岩本貢, 太田和夫, 崎山一男, “クロック間衝突を漏洩モデルとする新たなサイドチャネル解析と並列実装AES暗号ハードウェアにおける弱い鍵,” 電子情報通信学会論文誌(A), Vol.J97-A, No.11, pp.695–703 (Nov., 2014).
Sho Endo, Yang Li, Naofumi Homma, Kazuo Sakiyama, Kazuo Ohta, Daisuke Fujimoto, Makoto Nagata, Toshihiro Katashita, Jean-Luc Danger, and Takafumi Aoki, “A Silicon-level Countermeasure against Fault Sensitivity Analysis and Its Evaluation,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst., Vol.23, No.8, pp.1429–1438 (Aug., 2015).
