Young-Jae Cho, Takashi Hirakawa, Kazuo Sakiyama, Hiroaki Okamoto, and Yoshihiro Hamakawa, “ZnF2:Gd Thin Film Electroluminescent Device,” Appl. Surf. Sci., Vol.113/114 (1997), pp.705–708 (Apr., 1997).
Young-Jae Cho, Takashi Hirakawa, Kazuo Sakiyama, Hiroaki Okamoto, and Yoshihiro Hamakawa, “EL/PL hybrid device enhanced by UV emission from ZnF2:Gd thin film electroluminescence,” J. Korean. Phys. Soc., Vol.30(1997), pp.S65–S68 (Jun., 1997).
Shenglin Yang, Kazuo Sakiyama, and Ingrid Verbauwhede, ”Efficient and Secure Fingerprint Verification for Embedded Devices, EURASIP J. Appl. Signal Process., Vol.2006, No.1–11 (May, 2006).
Kazuo Sakiyama, Nele Mentens, Lejla Batina, Bart Preneel, and Ingrid Verbauwhede, “Reconfigurable Modular Arithmetic Logic Unit Supporting High-performance RSA and ECC over GF(p),” Int. J. Electron., Vol.94, No.5, pp.501–514 (May, 2007).
Kazuo Sakiyama, Lejla Batina, Bart Preneel, and Ingrid Verbauwhede, “High-performance Public-key Cryptoprocessor for Wireless Mobile Applications,” Mob. Netw. Appl., Vol.12, No.4, pp.245–258 (Aug., 2007).
Kazuo Sakiyama, Lejla Batina, Bart Preneel, and Ingrid Verbauwhede, ”HW/SW Co-design for Public-Key Cryptosystems on the 8051 Micro-controller, Comput. Electr. Eng., Vol.33, No.5–6, pp.324–332 (Sep., 2007).
Lejla Batina, Kazuo Sakiyama, and Ingrid Verbauwhede, “Architectures for Public-key Cryptography,” Chapter in Vojin G. Oklobdzija editor, Digital Systems and Applications, ISBN 978-0-8493-8619-0, CRC press (Nov., 2007).
Lejla Batina and Kazuo Sakiyama, “Compact Public-key Implementations for RFID and Sensor Nodes,” Chapter in Ingrid Verbauwhede editor, Secure Integrated Circuits and Systems, ISBN 978-0-387-71829-3, Springer, pp.179–196 (Feb., 2010).
Kazuo Sakiyama and Lejla Batina, “Arithmetic for Public-key Cryptography,” Chapter in Ingrid Verbauwhede editor, Secure Integrated Circuits and Systems, ISBN 978-0-387-71827-9, Springer, pp.63–78 (Feb., 2010).
Junko Takahashi, Toshinori Fukunaga, Shigeto Gomisawa, Yang Li, Kazuo Sakiyama, and Kazuo Ohta, “Fault Injection and Key Retrieval Experiments on Evaluation Board,” Chapter in Marc Joye and Michael Tunstall editors, Fault Analysis in Cryptography, ISBN 978-3-642-29656-7, Springer, pp.313–331 (Jul., 2012).
