Bagus Santoso, Kazuo Ohta, Kazuo Sakiyama, Goichiro Hanaoka, “An Efficient Authentication for Lightweight Devices by Perfecting Zero-Knowledgeness,” IEICE Trans. Fundam. Electron. Commun. Comput. Sci., Vol.A94-A, No.1, pp.92–103 (Jan., 2011).
Yang Li, Kazuo Sakiyama, Shinichi Kawamura, and Kazuo Ohta, “Power Analysis against a DPA-resistant S-box Implementation Based on the Fourier Transform,” IEICE Trans. Fundam. Electron. Commun. Comput. Sci., Vol.A94-A, No.1, pp.191–199 (Jan., 2011).
Kazuo Sakiyama, Miroslav Knežević, Junfeng Fan, Bart Preneel, and Ingrid Verbauwhede, “Tripartite Modular Multiplication,” Integration-VLSI J., Vol.44, Issue 4, pp.259–269 (Apr., 2011).
Lei Wang, Yu Sasaki, Wataru Komatsubara, Kazuo Sakiyama, Kazuo Ohta, “Meet-in-the-Middle (Second) Preimage Attacks on Two Double-Branch Hash Functions RIPEMD and RIPEMD-128,” IEICE Trans. Fundam. Electron. Commun. Comput. Sci., Vol.E95-A, No.1, pp.100–110 (Jan., 2012).
Yang Li, Kazuo Ohta, and Kazuo Sakiyama, “Toward Effective Countermeasures Against an Improved Fault Sensitivity Analysis,” IEICE Trans. Fundam. Electron. Commun. Comput. Sci., Vol.A95-A, No.1, pp.234–241 (Jan., 2012).
Junko Takahashi, Toshinori Fukunaga, Kazuo Sakiyama, “Differential Fault Analysis on Stream Cipher MUGI,” IEICE Trans. Fundam. Electron. Commun. Comput. Sci., Vol.E95-A, No.1, pp.242–251 (Jan., 2012).
Yang Li, Kazuo Ohta, and Kazuo Sakiyama, “New Fault-Based Side-Channel Attack Using Fault Sensitivity,” IEEE Trans. Inf. Forensic Secur., Vol.7, No.1, pp.88–97 (Feb., 2012).
Kazuo Sakiyama, Yang Li, Mitsugu Iwamoto, and Kazuo Ohta, “Information-Theoretic Approach to Optimal Differential Fault Analysis,” IEEE Trans. Inf. Forensic Secur., Vol.7, No.1, pp.109–120 (Feb., 2012).
Miroslav Knežević, Kazuyuki Kobayashi, Jun Ikegami, Shin’ichiro Matsuo, Akashi Satoh, Ünal Kocabaş, Junfeng Fan, Toshihiro Katashita, Takeshi Sugawara, Kazuo Sakiyama, Ingrid Verbauwhede, Kazuo Ohta, Naofumi Homma, and Takafumi Aoki, “Fair and Consistent Hardware Evaluation of Fourteen Round Two SHA-3 Candidates,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst., Vol.20, No.5, pp.827–840 (May, 2012).
小池彩歌, 李陽, 中津大介, 太田和夫, 崎山一男, “複数の要因に対する新たな故障感度解析,” 電子情報通信学会論文誌(A), Vol.J95-A, No.10, pp.751–755 (Oct., 2012).
