Junko Takahashi, Toshinori Fukunaga, Shigeto Gomisawa, Yang Li, Kazuo Sakiyama, and Kazuo Ohta, “Fault Injection and Key Retrieval Experiments on Evaluation Board,” Chapter in Marc Joye and Michael Tunstall editors, Fault Analysis in Cryptography, ISBN 978-3-642-29656-7, Springer, pp.313–331 (Jul., 2012).