Kohei Matsuda, Sho Tada, Makoto Nagata, Yang Li, Takeshi Sugawara, Mitsugu Iwamoto, Kazuo Ohta, Kazuo Sakiyama, and Noriyuki Miura, “An Information Leakage Sensor Based on Measurement of Laser-Induced Opto-Electric Bulk Current Density,” In Extended Abstracts of International Conference on Solid State Devices and Materials (SSDM’19), M-1-03, pp.501–502 (Sep., 2019).