Kohei Matsuda, Tatsuya Fujii, Natsu Shoji, Takeshi Sugawara, Kazuo Sakiyama, Yu-ichi Hayashi, Makoto Nagata, and Noriyuki Miura, “A 286 F2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser against Laser Fault Injection Attack on Cryptographic Processor,” IEEE Journal of Solid-State Circuits, Vol.53, No.11, pp. 3174–3182 (Nov., 2018).