Sho Endo, Yang Li, Naofumi Homma, Kazuo Sakiyama, Kazuo Ohta, Daisuke Fujimoto, Makoto Nagata, Toshihiro Katashita, Jean-Luc Danger, and Takafumi Aoki, “A Silicon-level Countermeasure against Fault Sensitivity Analysis and Its Evaluation,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst., Vol.23, No.8, pp.1429–1438 (Aug., 2015).