Kazuo Sakiyama, Reina Yagasaki, Takanori Machida, Tatsuya Fujii, Noriyuki Miura, and Yu-ichi Hayashi, “Circuit-Level Information Leakage Prevention for Fault Detection,” In Proc. URSI Asia-Pacific Radio Science Conference (URSI AP-RASC’16), IEEE, pp.1271–1274 (Aug., 2016).
Momoka Kasuya, Takanori Machida, and Kazuo Sakiyama, “New Metric for Side-Channel Information Leakage: Case Study on EM Radiation from AES Hardware,” In Proc. URSI Asia-Pacific Radio Science Conference (URSI AP-RASC’16), IEEE, pp.1288–1291 (Aug., 2016).
Risa Yashiro, Takanori Machida, Mitsugu Iwamoto, and Kazuo Sakiyama, “Deep-Learning-Based Security Evaluation on Authentication Systems Using Arbiter PUF and Its Variants,” In Proc. International Workshop on Security 2016 (IWSEC’16), LNCS 9836, Springer-Verlag, pp.267–285 (Sep., 2016).
Kohei Matsuda, Noriyuki Miura, Makoto Nagata, Yu-ichi Hayashi, Tatsuya Fujii, and Kazuo Sakiyama, “On-Chip Substrate-Bounce Monitoring for Laser-Fault Countermeasure,” In Proc. 2016 IEEE Asian Hardware-Oriented Security and Trust (AsianHOST’16), IEEE, pp.1–6 (Dec. 2016).
Momoka Kasuya and Kazuo Sakiyama, “Improved EM Side-Channel Authentication Using Profile-Based XOR Model,” In Proc. International Workshop on Information Security Applications (WISA’17), LNCS 10763, Springer-Verlag, pp.173–183 (Aug., 2017).
Eito Miyamoto, Takeshi Sugawara, and Kazuo Sakiyama, “Efficient Software Implementation of Modular Multiplication in Prime Fields on TI’s DSP TMS320C6678,” In Proc. International Workshop on Information Security Applications (WISA’17), LNCS 10763, Springer-Verlag, pp.261–273 (Aug., 2017).
Takeshi Sugawara, Natsu Shoji, Kazuo Sakiyama, Kohei Matsuda, Noriyuki Miura, and Makoto Nagata, “Exploiting Bitflip Detector for Non-Invasive Probing and its Application to Ineffective Fault Analysis,” In Proc. Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC’17), IEEE, pp.49–56 (Sep., 2017).
Kohei Matsuda, Tatsuya Fujii, Natsu Shoji, Takeshi Sugawara, Kazuo Sakiyama, Yu-ichi Hayashi, Makoto Nagata, and Noriyuki Miura, “A 286 F2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack,” Dig. Tech. Papers, 2018 IEEE Intl. Solid-State Circuits Conference (ISSCC’18), IEEE, #21.5, pp.352–354 (Feb. 2018).
Shoei Nashimoto, Daisuke Suzuki, Takeshi Sugawara, and Kazuo Sakiyama,”Sensor CON-Fusion: Defeating Kalman Filter in Signal Injection Attack,” In Proc. Asia Conference on Computer and Communications Security (AsiaCCS’18), ACM, pp.511–524 (Jun., 2018).
Jean-Luc Danger, Risa Yashiro, Tarik Graba, Sylvain Guilley, Yves Mathieu, Noriyuki Miura, Abdelmalek Si-Merabet, Kazuo Sakiyama, and Makoto Nagata, “Analysis of Mixed PUF-TRNG Circuit Based on SR-Latches in FD-SOI Technology,” In Proc. Euromicro Conference on Digital System Design (DSD’18), IEEE, pp.508–515 (Aug., 2018).
